Crystals are ubiquitous: most metals, for example, are crystalline. Known for the almost perfect organization of their atoms, crystals nonetheless always contain imperfections, which are called ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

The current defect inspection systems for packaging are running out of steam for the latest advanced packages, prompting the need for new tools in the market. All of this comes at a time when the ...